Central Electron Microscopy Facility

The Central Electron Microscopy Facility is housed on the first floor of Roberts Hall in the Earl and Mary Roberts Characterization Facility. The Central Electron Microscopy Facility features eight operating electron microscopes: four Transmission Electron Microscopes and four Scanning Electron Microscopes, including one Dual Beam Focused Ion Bean Scanning Microscope.

Transmission Electron Microscopy

The FEI Tecnai F20 Field Emission Transmission Electron Microscope with a point resolution of 0.23 nm and Scanning Transmission Electron capability with a resolution of 0.2 nm. The Tecnai F20 is equipped with the Gatan Imaging Filter and Energy Dispersive Xray, and all of the imaging and spectroscopy software are interfaced with the microscope central computer. The F20 microscope is also equipped with a Lorentz lens for magnetic imaging using Fersnel and Fouccault modes.

The Titan 80-300 is an Aberration Corrected High Resolution Transmission and Scanning Transmission Electron Microscope having an accelerating voltage of 300 kv, with  a resolution 0.07 nm. It is equipped with a Gatan Tridiem Image Filter and an Energy Dispersive X-ray detector.

The JEOL 2000EX Transmission Electron Microscope has a resolution 0.24 nm and two Gatan Imaging System. This microscope is also configured for in situ specimen heating and cooling.

The Philips CM12 is a Transmission Electron Microscope and Scanning Transmission Electron Microscope, equipped with Energy Dispersive Xray and a Gatan CCD camera. The microscope is configured with texture analysis using automated crystallography for Transmission Electron Microscopes.

Scanning Electron Microscopy

The FEI XL-30 Field Emission Microscope has a resolution of 2 nm. The microscope is equipped with Energy Dispersive and Wavelength Dispersive X-ray Detectors and an electron-beam induced current (EBIC) imaging system. The system is fully quantitative, with X-ray imaging and an Oxford HKL Electron Backscatter Diffraction system capable of carrying out automated Orientation Imaging Microscopy (OIM). 

The Quanta 200 Field Emission Environmental Scanning Electron Microscope features a dedicated Orientation Imaging (OIM) System and high speed Hikiari camera.

The Quanta 600 Field Emission Environmental Scanning Electron Microscope, with cooling stage, heating stage, AFM and a TSL orientation imaging system

The NovaLab 600 Dual Beam, Focused Ion Beam and Field Emission Scanning Electron Microscope, hast the latest Orientation Imaging system with a high speed Hikari camera as well as an Autoprobe Lift-Out tool.

For information contact:

N.T Nuhfer, Director Electron Microscopy and Materials Characterization
Email: tn06@andrew.cmu.edu
Phone: 412-268-2691