Scanning Probe Microscopy

A Veeco Dimension 3100 scanning probe microscope is located on the first floor of Roberts Hall in the Earl and Mary Roberts Characterization Laboratory.

The probe has an XYZ closed loop head.  It can be used for Scanning Tunneling Microscopy (STM), as well as tapping, contact, and non-contact modes of Atomic Force Microscopy (AFM).

Many techniques can be performed on the Veeco including Magnetic and Electric Force Microscopy, Lateral Force Microscopy, Surface Potential Microscopy, NanoLithography, and NanoManipulation.

For information contact:

Jason Wolf
X-Ray Lab Supervisor
jwolf@cmu.edu