Specimen Preparation Facility

The JEMR Facility includes a complete specimen preparation facility for transmission and surface specimen preparation. Supporting the specimen preparation for transmission electron microscopy are three Gatan Precision Ion Polishing machines, four dimpling machines, and an electro-polishing system. Surface preparation for scanning electron microscopy specimens includes high vacuum sputter coating and ion etching equipment. For advanced sample preparation, the The NovaLab 600 Dual Beam, Focused Ion Beam and Field Emission Scanning Electron Microscope, is available.

Ancillary equipment to facilitate particular sample preparation techniques include: Southbay crystal orientation and cutting equipment, an Elox Electric Discharge Machine (EDM) for stress free cutting, a Struers-Abramin automated sample polishing apparatus, electropolishers and jet thinners, and two Vacuum Atmospheres Corp. glove boxes.